FRICTION MECHANISMS OF MOS2 IN A VACUUM

被引:0
|
作者
UEMURA, M
机构
关键词
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
引用
收藏
页码:855 / 859
页数:5
相关论文
共 50 条
  • [21] Influence of reciprocating friction on friction and wear characteristics of MoS2 films
    Dong, Shaojiang
    Cheng, Weilun
    Yao, Jinbao
    RESULTS IN ENGINEERING, 2023, 18
  • [22] Atomic Scale Simulation on the Anti-Pressure and Friction Reduction Mechanisms of MoS2 Monolayer
    Liu, Yang
    Liu, Yuhong
    Ma, Tianbao
    Luo, Jianbin
    MATERIALS, 2018, 11 (05)
  • [23] Mechanisms and improvements in the friction and wear behavior using MoS2 nanotubes as potential oil additives
    Kalin, M.
    Kogovsek, J.
    Remskar, M.
    WEAR, 2012, 280 : 36 - 45
  • [24] MoS2 sputtering coating for ultraghigh vacuum manipulation
    Maruyama, Toshiyuki
    Nakagawa, Jun
    Endo, Katsumi
    Kasahara, Akira
    Goto, Masahiro
    Tosa, Masahiro
    15TH INTERNATIONAL CONFERENCE ON THIN FILMS (ICTF-15), 2013, 417
  • [25] ULTRALOW FRICTION FILMS OF MOS2 FOR SPACE APPLICATIONS
    ROBERTS, EW
    THIN SOLID FILMS, 1989, 181 : 461 - 473
  • [26] Electronic friction and tuning on atomically thin MoS2
    Shi, Bin
    Gan, Xuehui
    Yu, Kang
    Lang, Haojie
    Cao, Xing'an
    Zou, Kun
    Peng, Yitian
    NPJ 2D MATERIALS AND APPLICATIONS, 2022, 6 (01)
  • [27] Electronic friction and tuning on atomically thin MoS2
    Bin Shi
    Xuehui Gan
    Kang Yu
    Haojie Lang
    Xing’an Cao
    Kun Zou
    Yitian Peng
    npj 2D Materials and Applications, 6
  • [28] MoS2 (0001)/MoO3(010)/MoS2(0001) friction-reducing system
    Kamiya, S
    Tsuda, D
    Miura, K
    Sasaki, N
    WEAR, 2004, 257 (11) : 1133 - 1136
  • [29] SUPERLUBRICITY OF MOS2 - CRYSTAL ORIENTATION MECHANISMS
    MARTIN, JM
    PASCAL, H
    DONNET, C
    LEMOGNE, T
    LOUBET, JL
    EPICIER, T
    SURFACE & COATINGS TECHNOLOGY, 1994, 68 : 427 - 432
  • [30] Mechanisms of Photoconductivity in Atomically Thin MoS2
    Furchi, Marco M.
    Polyushkin, Dmitry K.
    Pospischil, Andreas
    Mueller, Thomas
    NANO LETTERS, 2014, 14 (11) : 6165 - 6170