IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：25

作者：

FAULKNER, RG

HOPKINS, TC

NORRGARD, K

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT MAT TECHNOL,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

[2] AB ATOMENERGI,STUDSVIK,SWEDEN

来源：

X-RAY SPECTROMETRY | 1977年 / 6卷 / 02期

关键词：

D O I：

10.1002/xrs.1300060205

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：73 / 79

页数：7

共 50 条

[21] SECONDARY-ELECTRON DETECTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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