HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ND-FE-B-TYPE SINTERED MAGNETS

被引：2
|
作者：
LIU, JF
LUO, HL
PAN, SM
SUN, Y
SHI, GS
机构：
[1] GEN RES INST NON-FERROUS MET,BEIJING,PEOPLES R CHINA
[2] BEIJING ANALYT & MEASUREMENT CTR PHYS & CHEM,BEIJING,PEOPLES R CHINA
来源：
JOURNAL OF APPLIED PHYSICS | 1991年 / 69卷 / 08期
关键词：
D O I：
10.1063/1.347983
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Transmission electron microscopy (TEM) analysis showed that the grain-boundary thin layer is a kind of Nd-rich phase. The high-resolution micrographs of the grain-boundary thin layer were obtained. The lattice constant c of the matrix phase is measured as 12.2 angstrom. The grain-boundary thin layer is coherent with the matrix.
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页码：5510 / 5511
页数：2
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