THE DEVELOPMENT OF AN ULTRA-HIGH VACUUM SCANNING TUNNELING MICROSCOPE (UHV-STM)

被引：0
|
作者：
IWATSUKI, M [1 ]
KITAMURA, S [1 ]
UCHIUMI, H [1 ]
CHIBA, S [1 ]
KOBAYASHI, H [1 ]
MOGAMI, A [1 ]
机构：
[1] JEOL LTD,AKISHIMA,TOKYO 196,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 04期
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：288 / 288
页数：1
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