A HIGH-CONTRAST DIRECTIONAL DETECTOR FOR SCANNING ELECTRON MICROSCOPE

被引:11
|
作者
BANBURY, JR
NIXON, WC
机构
来源
关键词
D O I
10.1088/0022-3735/2/12/310
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1055 / &
相关论文
共 50 条
  • [21] SILICON DETECTOR FOR STEREOSCAN SCANNING ELECTRON-MICROSCOPE
    MUNDEN, AB
    WALKER, DEY
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (09): : 916 - 920
  • [22] A HIGH-CONTRAST PHOTOGRAPHIC RECORDER FOR SCINTILLATION COUNTER SCANNING
    KUHL, DE
    CHAMBERLAIN, RH
    HALE, J
    GORSON, RO
    RADIOLOGY, 1956, 66 (05) : 730 - 739
  • [23] Topographic Contrast in the Linewidth Measurement with Scanning Electron Microscope
    Miyoshi, Motosuke
    Yamazaki, Yuichiro
    1600, Oxford University Press (35):
  • [24] TECHNIQUE FOR LINEARIZATION OF VOLTAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE
    GOPINATH, A
    SANGER, CC
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (04): : 334 - &
  • [25] CALCULATION OF A TOPOGRAPHIC CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE
    KOTERA, M
    FUJIWARA, T
    YAMAGUCHI, S
    SUGA, H
    SCANNING MICROSCOPY, 1993, 7 (02) : 547 - 554
  • [26] METHOD OF ISOLATING VOLTAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE
    GOPINATH, A
    SANGER, CC
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (08): : 610 - &
  • [27] Contrast differences between scanning ion and scanning electron microscope images
    Suzuki, T
    Endo, N
    Shibata, M
    Kamasaki, S
    Ichinokawa, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (01): : 49 - 52
  • [28] High-contrast en bloc staining of neuronal tissue for field emission scanning electron microscopy
    Tapia, Juan Carlos
    Kasthuri, Narayanan
    Hayworth, Kenneth J.
    Schalek, Richard
    Lichtman, Jeff W.
    Smith, Stephen J.
    Buchanan, JoAnn
    NATURE PROTOCOLS, 2012, 7 (02) : 193 - 206
  • [29] High-contrast en bloc staining of neuronal tissue for field emission scanning electron microscopy
    Juan Carlos Tapia
    Narayanan Kasthuri
    Kenneth J Hayworth
    Richard Schalek
    Jeff W Lichtman
    Stephen J Smith
    JoAnn Buchanan
    Nature Protocols, 2012, 7 : 193 - 206
  • [30] AN IMAGING SECONDARY-ELECTRON DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE
    HASSELBACH, F
    RIEKE, U
    STRAUB, M
    SCANNING ELECTRON MICROSCOPY, 1983, : 467 - 478