ALUMINA SUPER-MICROGRID FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引:0
|
作者
FUJIYOSHI, Y
UYEDA, N
机构
来源
JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 02期
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:75 / 82
页数:8
相关论文
共 50 条
  • [41] NEW TECHNIQUE IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    MIHAMA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 57
  • [42] THE DEVELOPMENT OF INSITU HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SINCLAIR, R
    YAMASHITA, T
    PARKER, MA
    KIM, KB
    HOLLOWAY, K
    SCHWARTZMAN, AF
    ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 965 - 975
  • [43] HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS
    LI, FH
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 7 (04): : 237 - 254
  • [44] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SILICON CERAMICS
    CLARKE, DR
    AMERICAN CERAMIC SOCIETY BULLETIN, 1977, 56 (03): : 295 - 295
  • [45] PROBLEMS OF INTERPRETATION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    HOWIE, A
    JOURNAL OF MICROSCOPY-OXFORD, 1983, 129 (MAR): : 239 - 251
  • [46] POSSIBLE TRANSMITTING ELECTRON-MICROSCOPY OF HIGH-RESOLUTION
    VERTSNER, VN
    VOROBEV, YV
    VORONIN, YM
    ZHUKOV, VA
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1974, 38 (11): : 2243 - 2258
  • [47] HEXAGONAL GERMANIUM AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
    PARSONS, JR
    HOELKE, CW
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 50 (03): : 329 - 337
  • [48] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF POLYDIACETYLENE CRYSTALS
    BEBBINGTON, EMO
    YOUNG, RJ
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 335 - 336
  • [49] HIGH-RESOLUTION ELECTRON-MICROSCOPY IN POLYMERIC MATERIALS
    ISODA, S
    TSUJI, M
    KAWAGUCHI, K
    KATAYAMA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 99 - 99
  • [50] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF BELITE
    WANG, YG
    ZOU, BS
    KUO, KH
    FENG, XJ
    WANG, L
    LONG, SZ
    JOURNAL OF MATERIALS SCIENCE, 1989, 24 (03) : 877 - 880