AUTOMATIC-GENERATION OF TEST VECTORS AT THE TRANSISTOR LEVEL

被引：0

|

作者：

ELMAIDI, E ^{[1
]}

FLOTTES, ML ^{[1
]}

LANDRAULT, C ^{[1
]}

PRAVOSSOUDOVITCH, S ^{[1
]}

机构：

[1] UNIV MONTPELLIER 2,LAB AUTOMAT & MICROELECTR MONTPELLIER,F-34060 MONTPELLIER,FRANCE

来源：

TSI-TECHNIQUE ET SCIENCE INFORMATIQUES | 1989年 / 8卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

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收藏

页码：583 / 591

页数：9

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