X-RAY DIFFUSE-SCATTERING STUDY OF NB-TI B C C SOLUTION

被引:42
|
作者
RUDMAN, PS
机构
来源
ACTA METALLURGICA | 1964年 / 12卷 / 12期
关键词
D O I
10.1016/0001-6160(64)90126-9
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:1381 / &
相关论文
共 50 条
  • [41] X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers
    Paniago, R
    Homma, H
    Chow, PC
    Moss, SC
    Barnea, Z
    Parkin, SSP
    Cookson, D
    PHYSICAL REVIEW B, 1995, 52 (24): : 17052 - 17055
  • [42] X-RAY DIFFUSE-SCATTERING IN PREMARTENSITIC PHASE OF A-15 COMPOUNDS
    KAMIGAKI, K
    SAKASHITA, H
    TERAUCHI, H
    TOYOTA, N
    FUKASE, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 : 935 - 936
  • [43] INTERPRETATION OF THE DIFFUSE-SCATTERING CLOSE TO BRAGG PEAKS BY X-RAY TOPOGRAPHY
    FEWSTER, PF
    ANDREW, NL
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 : 812 - 819
  • [44] X-RAY THERMAL DIFFUSE-SCATTERING IN ALUMINUM SINGLE-CRYSTAL
    SERVOMAA, A
    LINKOAHO, M
    ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S182 - S182
  • [45] X-RAY DIFFUSE-SCATTERING FROM WURTZITE-TYPE COMPOUNDS
    KOTO, K
    SCHULZ, H
    ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (NOV): : 971 - 974
  • [46] PHASON VELOCITIES IN TAS2 BY X-RAY DIFFUSE-SCATTERING
    MINOR, W
    CHAPMAN, LD
    EHRLICH, SN
    COLELLA, R
    PHYSICAL REVIEW B, 1989, 39 (02): : 1360 - 1362
  • [47] X-RAY DIFFUSE-SCATTERING OF QUENCHED COPPER SINGLE-CRYSTALS
    MAETA, H
    YAMAKAWA, K
    MATSUMOTO, N
    HARUNA, K
    KATO, T
    ONO, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 97 (1-4): : 491 - 494
  • [48] X-RAY DIFFUSE-SCATTERING FROM SILICON CONTAINING OXYGEN CLUSTERS
    PATEL, JR
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (APR1) : 186 - 191
  • [49] X-RAY DIFFUSE-SCATTERING BY HIGHLY ORIENTED PYROLYTIC-GRAPHITE
    TAMAKI, T
    WAKABAYASHI, N
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1990, 59 (03) : 959 - 964
  • [50] X-RAY DIFFUSE-SCATTERING BY MICRODEFECTS IN SILICON PREPARED WITH THE CZOCHRALSKI METHOD
    KOVEV, EK
    BUBLIK, VT
    POSTOLOV, VG
    FIZIKA TVERDOGO TELA, 1985, 27 (04): : 1246 - 1248