MULTIPLE-SCATTERING FROM ROUGH DIELECTRIC AND METAL-SURFACES USING THE KIRCHHOFF APPROXIMATION

被引：34
|
作者：
BRUCE, NC
DAINTY, JC
机构：
[1] The Blackett Laboratory, Imperial College, London
来源：
JOURNAL OF MODERN OPTICS | 1991年 / 38卷 / 08期
关键词：
D O I：
10.1080/09500349114551641
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The Kirchhoff double-scatter method for calculating the intensity distribution scattered from a rough surface is extended to dielectric and metal surface materials. The material properties are contained in the Fresnel reflection coefficients only. It is shown that the results agree well with calculations using the exact method for a surface of Gaussian statistics with standard deviation of height sigma = 1.93-lambda and 1/e correlation length tau = 5.02-lambda.
引用
收藏
页码：1471 / 1481
页数：11
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