ELECTRON-TRANSPORT SELF-SHIFT DISPLAY USING AN AC PLASMA PANEL

被引:4
|
作者
NGO, PDT
MALISZEWSKI, SR
机构
关键词
D O I
10.1109/T-ED.1981.20410
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:666 / 672
页数:7
相关论文
共 50 条
  • [21] Influence of Ion Bombardment on Electron Emission of MgO Surface in AC Plasma Display Panel
    Park, Choon-Sang
    Tae, Heung-Sik
    Jung, Eun-Young
    Seo, Jeong Hyun
    Shin, Bhum Jae
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2010, 38 (09) : 2439 - 2444
  • [22] ELECTRON-TRANSPORT IN A SPHERICALLY SYMMETRIC PLASMA
    GRANDEY, RA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (04) : 549 - 549
  • [23] Calculated characteristics of an ac plasma display panel cell
    Boeuf, JP
    Pitchford, LC
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 1996, 24 (01) : 95 - 96
  • [24] Striations in a coplanar ac-plasma display panel
    Cho, G
    Choi, EH
    Kim, YG
    Kim, DI
    Uhm, HS
    Joo, YD
    Han, JG
    Kim, MC
    Kim, JD
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 4113 - 4118
  • [25] ON THE STABILITY OF THE OPERATING VOLTAGES OF AC PLASMA DISPLAY PANEL
    ABOELFOTOH, MO
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (02) : 247 - 254
  • [26] SENSITIVE AC DIFFERENCE METHOD FOR ELECTRON-TRANSPORT MEASUREMENTS
    MUIR, WB
    STROMOLSEN, JO
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (03): : 163 - 164
  • [27] Protective layer using plasma polymerized thin films in ac-plasma display panel
    Kim, SO
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (01): : 233 - 236
  • [28] Improvement of MgO Characteristics Using RF-Plasma Treatment in AC Plasma Display Panel
    Park, Choon-Sang
    Tae, Heung-Sik
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2010, 531 : 73 - 81
  • [29] New color-enhancing dischargae mode using self-erasing discharge in AC plasma display panel
    Tae, HS
    Cho, BG
    Cho, KD
    Chien, SI
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2003, 31 (02) : 256 - 263
  • [30] ELECTRON BEAM ADDRESSED PLASMA DISPLAY PANEL
    GREGORY, R
    BISHOP, ML
    WEIL, RB
    PROCEEDINGS OF THE IEEE, 1969, 57 (05) : 805 - &