ANGULAR-DEPENDENCE OF CRITICAL-CURRENT IN AG-SEATHED BI(2223) SUPERCONDUCTOR TAPE

被引：1

作者：

GUO, SQ ^{[1
]}

QIN, XM ^{[1
]}

ZHANG, JL ^{[1
]}

WU, ZA ^{[1
]}

YE, B ^{[1
]}

ZENG, R ^{[1
]}

ZHOU, YR ^{[1
]}

ZHOU, M ^{[1
]}

机构：

[1] GEN RES INST NONFERROUS MET,BEIJING 100088,PEOPLES R CHINA

来源：

CHINESE PHYSICS LETTERS | 1993年 / 10卷 / 09期

关键词：

D O I：

10.1088/0256-307X/10/9/015

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The critical current I(c)(B. T. theta) of Ag-sheathed Bi(2223) tape was measured at 4.2 and 77 K magnetic field up to 6 T as a function of the field direction. The maximum I(c) is observed when the flux line are along the CuO2 planes. This effect is due to an intrinsic pinning between CuO2 layers. When H > 0.5 T at 4.2K. I(c) decreases very slowly with the magnetic field. The results are consistent with our early-proposed scaling laws for flux pinning in Ag-sheathed tape.

引用

页码：566 / 568

页数：3

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