INVERSE PHOTOEMISSION AND RESONANT PHOTOEMISSION CHARACTERIZATION OF SEMIMAGNETIC SEMICONDUCTORS

被引：12
|
作者：
WALL, A
FRANCIOSI, A
GAO, Y
WEAVER, JH
TSAI, MH
DOW, JD
KASOWSKI, RV
机构：
[1] UNIV NOTRE DAME,DEPT PHYS,NOTRE DAME,IN 46556
[2] DUPONT CO,DEPT CENT RES & DEV,WILMINGTON,DE 19898
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期
关键词：
D O I：
10.1116/1.575861
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：656 / 662
页数：7
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