ATTACHMENT FOR EXAMINING CUTTING TRACKS IN A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

ASHKEROV, YV

BYKOV, MV

REPKIN, MV

机构：

来源：

SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1988年 / 55卷 / 01期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：52 / 54

页数：3

共 50 条

[21] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE
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