STORED CHARGE METHOD OF TRANSISTOR BASE TRANSIT ANALYSIS

被引：27

|

作者：

VARNERIN, LJ

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS | 1959年 / 47卷 / 04期

关键词：

D O I：

10.1109/JRPROC.1959.287312

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：523 / 527

页数：5

相关论文

共 50 条

[21] SUBPICOSECOND BASE TRANSIT TIME OBSERVED IN A HOT-ELECTRON TRANSISTOR (HET).
Muto, S.
Imamura, K.
Yokoyama, N.
Hiyamizu, S.
Nishi, H.
Electronics Letters, 1985, 21 (13): : 555 - 556
[22] New expression for base transit time in an exponentially doped base bipolar transistor for all levels of injection
Khan, MZR
Hassan, MMS
Rahman, T
ICM 2003: PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2003, : 340 - 343
[23] EFFECT OF BASE PROFILE ON THE BASE TRANSIT-TIME OF THE BIPOLAR-TRANSISTOR FOR ALL LEVELS OF INJECTION
YUAN, JS
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (02) : 212 - 216
[24] New expression for base transit time in a bipolar transistor for all levels of injection
Hassan, MMS
Khandoker, AH
MICROELECTRONICS RELIABILITY, 2001, 41 (01) : 137 - 140
[25] TRANSIT TIME TRANSISTOR
WEINREICH, G
JOURNAL OF APPLIED PHYSICS, 1956, 27 (09) : 1025 - 1027
[26] ANALYSIS OF BASE TRANSIT-TIME OF DIFFUSED BASE TRANSISTORS
KAUSHIK, DK
CHATTOPADHYAYA, SK
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1978, 16 (08) : 770 - 775
[27] SUBPICOSECOND BASE TRANSIT-TIME OBSERVED IN A HOT-ELECTRON TRANSISTOR (HET)
MUTO, S
IMAMURA, K
YOKOYAMA, N
HIYAMIZU, S
NISHI, H
ELECTRONICS LETTERS, 1985, 21 (13) : 555 - 556
[28] PULSED MEASUREMENT OF TRANSISTOR-BASE CHARGE AGAINST COLLECTOR CURRENT
BRIDGEN, R
ELECTRONICS LETTERS, 1973, 9 (16) : 366 - 367
[29] Extended Base Schottky-collector Bipolar Charge Plasma Transistor
Bramhane, Lokesh Kumar
Singh, Jawar
2015 IEEE International Symposium on Nanoelectronic and Information Systems, 2015, : 137 - 140
[30] Base Transit Time of a Bipolar Junction Transistor Considering Majority-carrier Current
Chowdhury, Md Iqbal Bahar
Hassan, M. A. Shahidul
PROCEEDINGS OF ICECE 2008, VOLS 1 AND 2, 2008, : 133 - +

← 1 2 3 4 5 →