RELIABILITY OF PSEUDOPOTENTIAL CHARGE-DENSITIES

被引：0
|
作者：
SCHLUTER, M
ZUNGER, A
KERKER, G
HO, KM
COHEN, ML
机构：
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
[2] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1979年 / 24卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：466 / 466
页数：1
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