COMPUTER-SIMULATION OF X-RAY TOPOGRAPHS OF CURVED SILICON-CRYSTALS

被引:0
|
作者
GREEN, GS
TANNER, BK
机构
来源
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:627 / 632
页数:6
相关论文
共 50 条
  • [41] SIMULATION OF X-RAY REFLECTION TOPOGRAPHS FROM MISFIT DISLOCATIONS
    SPIRKL, W
    TANNER, BK
    WHITEHOUSE, C
    BARNETT, SJ
    CULLIS, AG
    JOHNSON, AD
    KEIR, A
    USHER, B
    CLARK, GE
    HAGSTON, W
    HOGG, CR
    LUNN, B
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1994, 69 (01): : 221 - 236
  • [42] Simulation of decorated dislocation images in X-ray section topographs
    Holland, AJ
    Tanner, BK
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 73 (05): : 1451 - 1474
  • [43] Simulation of decorated dislocation images in X-ray section topographs
    Holland, A. J.
    Tanner, B. K.
    Philosophical Magazine A: Physics of Condensed Matter, Defects and Mechanical Properties, 73 (05):
  • [44] X-ray characterization of curved crystals for hard x-ray astronomy
    Buffagni, Elisa
    Bonnini, Elisa
    Ferrari, Claudio
    Virgilli, Enrico
    Frontera, Filippo
    EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE IV, 2015, 9510
  • [45] X-RAY-SCATTERING BY THIN REAL SILICON-CRYSTALS
    KHRUPA, VI
    DATSENKO, LI
    FIZIKA TVERDOGO TELA, 1982, 24 (03): : 950 - 952
  • [46] MULTIPLE DIFFRACTION LINES IN THE SYNCHROTRON X-RAY TOPOGRAPHS OF ELASTICALLY BENT SILICON SINGLE-CRYSTALS
    TUOMI, T
    NAUKKARINEN, K
    PHYSICAL REVIEW B, 1981, 24 (10): : 6125 - 6128
  • [47] AREA AND MIXED CONTRAST IN X-RAY TOPOGRAPHS OF SILICON CRYSTALS STRAINED BY SIO2 FILMS
    GAJDA, WJ
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (03): : K143 - &
  • [48] X-RAY-DIFFRACTION TOPOGRAPHS OF SILICON CRYSTALS WITH SUPERPOSED OXIDE FILM
    ANDO, Y
    PATEL, JR
    KATO, N
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S213 - S213
  • [49] AN ANALYTICAL DESCRIPTION OF OBSERVED STRESS PATTERNS ON X-RAY TOPOGRAPHS OF SILICON
    WALFORD, LK
    CARRON, GJ
    JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) : 5802 - &
  • [50] OBSERVATION OF PENDELLOSUNG FRINGES IN REFLECTION-SECTION TOPOGRAPHS OF BENT SILICON-CRYSTALS
    CHEN, H
    MATERIALS LETTERS, 1986, 4 (02) : 65 - 70