共 50 条
- [41] SIMULATION OF X-RAY REFLECTION TOPOGRAPHS FROM MISFIT DISLOCATIONS PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1994, 69 (01): : 221 - 236
- [42] Simulation of decorated dislocation images in X-ray section topographs PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 73 (05): : 1451 - 1474
- [43] Simulation of decorated dislocation images in X-ray section topographs Philosophical Magazine A: Physics of Condensed Matter, Defects and Mechanical Properties, 73 (05):
- [44] X-ray characterization of curved crystals for hard x-ray astronomy EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE IV, 2015, 9510
- [45] X-RAY-SCATTERING BY THIN REAL SILICON-CRYSTALS FIZIKA TVERDOGO TELA, 1982, 24 (03): : 950 - 952
- [46] MULTIPLE DIFFRACTION LINES IN THE SYNCHROTRON X-RAY TOPOGRAPHS OF ELASTICALLY BENT SILICON SINGLE-CRYSTALS PHYSICAL REVIEW B, 1981, 24 (10): : 6125 - 6128
- [47] AREA AND MIXED CONTRAST IN X-RAY TOPOGRAPHS OF SILICON CRYSTALS STRAINED BY SIO2 FILMS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (03): : K143 - &
- [48] X-RAY-DIFFRACTION TOPOGRAPHS OF SILICON CRYSTALS WITH SUPERPOSED OXIDE FILM ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S213 - S213