A NEW APPROACH TO THE BIASING PROBLEM AND THE FAULT LOCALIZATION OF NON-LINEAR ELECTRONIC-CIRCUITS

被引：3
|
作者：
THEEUWEN, JFM
JESS, JAG
机构：
来源：
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1982年 / 29卷 / 03期
关键词：
D O I：
10.1109/TCS.1982.1085124
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：125 / 135
页数：11
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