共 50 条
- [42] Comparison of the submicron particle analysis capabilities of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and scanning electron microscopy with energy dispersive x-ray spectroscopy for particles deposited on silicon wafers with 1 μm thick oxide layers JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (03): : 1825 - 1831
- [43] SURFACE STUDIES OF BASALT USING SCANNING AUGER MICROSCOPY (SAM), X-RAY PHOTO-ELECTRON SPECTROSCOPY (XPS), SCANNING ELECTRON-MICROSCOPY (SEM), AND SECONDARY ION MASS-SPECTROMETRY (SIMS) ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1982, 183 (MAR): : 55 - GEOC
- [44] Morphological and elemental analysis of alpaca hair using scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM-EDX) MEDYCYNA WETERYNARYJNA-VETERINARY MEDICINE-SCIENCE AND PRACTICE, 2018, 74 (05): : 295 - 300
- [50] ADHESION ENHANCEMENT OF MAGNETRON-SPUTTERED COPPER-FILMS BY ION-BOMBARDMENT ETCHING TREATMENT OF NICKEL AND INCONEL SUBSTRATES - INVESTIGATIONS BY AUGER-ELECTRON SPECTROSCOPY AND SECONDARY ION MASS-SPECTROSCOPY OF THE ION-BEAM EFFECTS JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1991, 5 (11) : 987 - 999