We present a rigorous and accurate model for multichannel direct detection systems where optical preamplification is used. The model accounts for the influence of an optical bandlimiting filter as well as of a polarization filter. Effects of laser phase noise, spontaneous emission noise from the amplifier and of shot noise and thermal noise in the receiver front end are accounted for. For a single optical channel without any phase noise or receiver noise and with a polarization filter our model is in agreement with exact results from Henry who specifies a limiting 10(-9) error-rate sensitivity of 76 received photons. The predicted phase noise penalty for that single channel configuration is found to be close to earlier results from Foschini, Greenstein, and Vannucci as well as to results by Tonguz and Kazovsky. The omission of a polarization filter is found to degrade the system sensitivity less than 1 dB for a single channel with a linewidth less than the bit rate. For multichannel system design we find that a system with many optical channels and no phase noise should have a channel separation of 9.4 bit rates to have less than 1 dB worst-case crosstalk penalty. For a linewidth of 27% of the bit-rate in each channel the required spacing increases to 27 bit rates or more.
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Radar Syst Grp, Integrated Test Range, Def Res & Dev Org, Chandipur, Orissa, IndiaRadar Syst Grp, Integrated Test Range, Def Res & Dev Org, Chandipur, Orissa, India
Ray, Arun Kumar
Shit, Rathin Chandra
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Radar Syst Grp, Integrated Test Range, Def Res & Dev Org, Chandipur, Orissa, IndiaRadar Syst Grp, Integrated Test Range, Def Res & Dev Org, Chandipur, Orissa, India
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Univ Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R ChinaUniv Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
Han, Changxuan
Deng, Zhixian
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Univ Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R ChinaUniv Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
Deng, Zhixian
Shu, Yiyang
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Univ Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R ChinaUniv Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
Shu, Yiyang
Yin, Jun
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Univ Macau, Inst Microelect, State Key Lab Analog & Mixed Signal VLSI, Macau, Peoples R China
Univ Macau, Fac Sci & Technol, Dept Elect & Commun Engn ECE, Macau, Peoples R ChinaUniv Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
Yin, Jun
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Mak, Pui-In
Luo, Xun
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Univ Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
Univ Elect Sci & Technol China UESTC, Shenzhen Inst Adv Study, Shenzhen 518110, Peoples R ChinaUniv Elect Sci & Technol China UESTC, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China