AUGER ANALYSIS OF THIN-FILM SANDWICH STRUCTURES

被引:2
|
作者
NANDA, MM
机构
来源
关键词
D O I
10.1116/1.569492
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:248 / 248
页数:1
相关论文
共 50 条
  • [21] AUGER SPUTTER DEPTH PROFILING ANALYSIS OF NI/CR MULTILAYER THIN-FILM
    OGIWARA, T
    TANUMA, S
    BUNSEKI KAGAKU, 1992, 41 (12) : T157 - T161
  • [22] FORWARD RECOILING SPECTROSCOPY ANALYSIS OF THIN-FILM ELECTROLUMINESCENT STRUCTURES
    LAPPALAINEN, R
    POKELA, PJ
    THIN SOLID FILMS, 1991, 196 (02) : 215 - 221
  • [23] APPLICATION OF AUGER-ELECTRON DEPTH PROFILE ANALYSIS TO THIN-FILM INTERDIFFUSION STUDIES
    PAMLER, W
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 42 (03): : 219 - 226
  • [24] GROWTH OF EUTECTIC THIN-FILM STRUCTURES
    CLINE, HE
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) : 5898 - 5903
  • [25] AUGER ANALYSIS OF CDS-CUINSE2 THIN-FILM SOLAR-CELLS
    KAZMERSKI, LL
    COOPER, RB
    WHITE, FR
    MERRILL, AJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (04) : 496 - 498
  • [26] MULTILAYER THIN-FILM STRUCTURES OF ALGAAS
    ZORY, P
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (08) : 1047 - 1047
  • [27] Radiophysical Processes in Thin-Film Structures
    Bezuglov, Dmitry A.
    Sinyaysky, Gennady P.
    Cherckesova, Larissa V.
    Shein, Alexander G.
    Shalamov, George N.
    Zaichenko, Alexander N.
    Manaenkova, Olga N.
    PROCEEDINGS OF 2016 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS), 2016,
  • [28] AGING OF THIN-FILM ELECTROLUMINESCENT STRUCTURES
    VERESHCHAGIN, IK
    KOKIN, SM
    OSTRYI, IY
    PARFYONOV, NM
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1985, 28 (03): : 104 - 106
  • [29] ARE THIN-FILM PHYSICAL STRUCTURES FRACTALS
    YEHODA, JE
    MESSIER, R
    APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 590 - 595
  • [30] DIGITAL METHODS FOR THIN-FILM ANALYSIS USING A COMPUTER-COUPLED AUGER SPECTROMETER
    KEENAN, JA
    MCGUIRE, GE
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (08) : C247 - C247