THE MATRIX DEPENDENCE OF ION EMISSION FROM URANIUM-OXIDES

被引：6

作者：

ALLEN, GC ^{[1
]}

BROWN, IT ^{[1
]}

HARRIS, SJ ^{[1
]}

机构：

[1] BRITISH AEROSP PLC,SOWERBY RES CTR,BRISTOL BS12 7QW,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 88卷 / 1-2期

关键词：

D O I：

10.1016/0168-583X(94)96099-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A number of uranium oxide phases have been characterised using secondary ion mass spectrometry (SIMS). The stability of the uranium oxide ions UO+ and UO2+ formed on sputtering uranium oxide surfaces leads to strong signals from these fragments. The relative magnitude of the signal from each ion depends on the chemical environment from which they are sputtered and the uranium/oxygen ratio. Dust particles from the Chernobyl accident were identified as having formed under highly reducing conditions.

引用

页码：170 / 173

页数：4

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