SYMMETRIES OF THE HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGE

被引：0
|
作者：
PORTIER, R [1 ]
GRATIAS, D [1 ]
机构：
[1] CTR ETUD CHIM MET,F-94400 VITRY SUR SEINE,FRANCE
来源：
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：A21 / A21
页数：1
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