SYMMETRIES OF THE HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGE

被引：0

作者：

PORTIER, R ^{[1
]}

GRATIAS, D ^{[1
]}

机构：

[1] CTR ETUD CHIM MET,F-94400 VITRY SUR SEINE,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：A21 / A21

页数：1

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