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- [31] Combinational Test Generation for Transition Faults in Acyclic Sequential Circuits 2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2, 2008, : 398 - 402
- [36] Removal of redundancy in combinational circuits under classification of undetectable faults Systems and Computers in Japan, 1993, 24 (07): : 31 - 40
- [38] Test Pattern Generation for the Combinational Representation of Asynchronous Circuits PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, 2010, : 323 - 328