DLTS STUDIES OF OXYGEN-CLUSTER DOPED AND PHOSPHORUS-DOPED SILICON IRRADIATED WITH 1.5 MEV ELECTRONS

被引：0
|
作者：
JELLISON, GE [1 ]
CLELAND, JW [1 ]
机构：
[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1980年 / 25卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：291 / 292
页数：2
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