BIREFRINGENCE OF OBLIQUELY EVAPORATED THIN FILMS

被引：0
|
作者：
NEUGEBAUER, E
VONFRAGS.C
机构：
来源：
OPTIK | 1969年 / 29卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：150 / +
页数：1
相关论文
共 50 条
  • [41] Columnar grain structure in cobalt films evaporated obliquely at low substrate temperatures
    Itoh, Kikuo
    Ichikawa, Fusao
    Takahashi, Yoshinori
    Tsutsumi, Kei
    Noguchi, Yoshie
    Okamoto, Kunito
    Uchiyama, Tetsuji
    Iguchi, Ienari
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (4 A): : 2534 - 2538
  • [42] ALIGNMENT AND ELECTROOPTIC PROPERTIES OF SSFLC CELLS ALIGNED BY OBLIQUELY EVAPORATED SIO FILMS
    KAHO, S
    MASUMI, T
    TAHATA, S
    MIZUNUMA, M
    MIYAKE, S
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1991, 199 : 87 - +
  • [43] SURFACE-ENHANCED RAMAN-SCATTERING OF OBLIQUELY EVAPORATED AG FILMS
    MARTINEZ, JL
    GAO, Y
    LOPEZRIOS, T
    PHYSICAL REVIEW B, 1986, 33 (08): : 5917 - 5919
  • [44] Thermally evaporated aluminium thin films
    Semaltianos, NG
    APPLIED SURFACE SCIENCE, 2001, 183 (3-4) : 223 - 229
  • [45] THIN EVAPORATED CALCIUM FLUORIDE FILMS
    BANNON, J
    COOGAN, CK
    NATURE, 1949, 163 (4132) : 62 - 63
  • [46] GLAZED SUBSTRATES FOR EVAPORATED THIN FILMS
    ETTRE, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1964, 1 (02): : 78 - &
  • [47] INHOMOGENEOUS CONCENTRATION DISTRIBUTION IN OBLIQUELY EVAPORATED Fe-Cu FILMS.
    Keitoku, Susumu
    Kamimori, Tatsuo
    Goto, Mitita
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1986, 25 (11): : 1668 - 1671
  • [48] OPTICAL ANISOTROPY IN PLANE PARALLEL TO SURFACE OF OBLIQUELY EVAPORATED GOLD-FILMS
    KAWABATA, S
    ICHIJI, K
    SURFACE SCIENCE, 1976, 56 (01) : 316 - 321
  • [49] MAGNETIC RECORDING PATTERNS OF OBLIQUELY EVAPORATED CO-O THIN-FILMS OBSERVED BY USING ULTRAFINE CO PARTICLES
    SAKURAI, T
    KITAKAMI, O
    SHIMADA, Y
    JOURNAL OF APPLIED PHYSICS, 1994, 76 (05) : 3177 - 3180
  • [50] Ex situ ellipsometric investigation of nanocolumns inclination angle of obliquely evaporated silicon thin films -: art. no. 153103
    Beydaghyan, G
    Buzea, C
    Cui, Y
    Elliott, C
    Robbie, K
    APPLIED PHYSICS LETTERS, 2005, 87 (15) : 1 - 3
12345