HREM SIMULATIONS OF AG PARTICLES IN SODIUM-SILICATE GLASSES REFINED BY MOLECULAR DYNAMIC RELAXATIONS

被引:6
|
作者
TIMPEL, D
SCHEERSCHMIDT, K
机构
[1] Max-Planck-Institut Für Mikrostrukturphysik, Halle
来源
关键词
D O I
10.1002/pssa.2211500106
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Providing local information at an atomic level high resolution electron microscopy (HREM) is applied to investigate Ag particles in sodium silicate glasses. Here, the structure of the embedded metallic particles, which influence the properties of glasses, is described by molecular dynamics relaxation calculations. The possibility of HREM to vizualize the structural modifications owing to relaxations is discussed on the basis of simulated HREM micrographs.
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页码:51 / 63
页数:13
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