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- [1] VARIATION OF THE YIELD OF ELECTRON-EMISSION FROM SINGLE-CRYSTALS WITH THE DIFFRACTION CONDITION OF EXCITING X-RAYSJAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 271 - 274KIKUTA, STAKAHASHI, T
- [2] ANGULAR-DEPENDENCE OF YIELD OF ELECTRON-EMISSION FROM A SILICON SINGLE-CRYSTAL UNDER DIFFRACTION PROCESS OF EXCITING X-RAYSACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S244 - S244KIKUTA, STAKAHASHI, TTUZI, Y
- [3] DEPENDENCE OF EMISSION YIELD OF X-RAYS FROM A SINGLE CRYSTAL ON DIFFRACTION CONDITION OF EXCITING ELECTRONSJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 22 (02) : 670 - &MIYAKE, SHAYAKAWA, KMIIDA, R
- [6] ELECTRON-EMISSION FROM A DIAMOND SINGLE-CRYSTALJETP LETTERS, 1992, 55 (10) : 606 - 608GANENKO, VBGUSHCHIN, VAZHEBROVSKII, YVKOLESNIKOV, LYRUBASHKIN, ALSOROKIN, PV
- [7] EFFECT ON ASYMMETRIC BRAGG-CASE DIFFRACTION OF X-RAYS ON YIELD OF X-RAY PHOTOELECTRONS FROM A SILICON SINGLE-CRYSTALJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1977, 42 (04) : 1433 - 1434TAKAHASHI, TKIKUTA, S
- [8] ANOMALOUS ENHANCEMENT OF TRANSMITTED INTENSITY IN ASYMMETRIC DIFFRACTION OF X-RAYS FROM A SINGLE-CRYSTALJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1972, 33 (01) : 158 - &KISHINO, SKOHRA, KNODA, A
- [9] VARIATION OF BRAGG-CASE DIFFRACTION CURVES OF X-RAYS FROM A THIN SILICON CRYSTAL WITH CRYSTAL THICKNESSJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1970, 29 (03) : 806 - &HASHIZUM.HNAKAYAMA, KMATSUSHI.TKOHRA, K
- [10] Determining the Orientation of a Single-Crystal and the Absolute Energy of X-Rays Using Diffraction LossesJournal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2023, 17 : 1094 - 1102N. B. KlimovaA. A. Snigirev