(310) SINGLE-CRYSTAL LAB6 AS THERMAL FIELD EMITTER OF HIGH BRIGHTNESS ELECTRON SOURCE

被引：0
|
作者：
HARADA, K
NAGATA, H
SHIMIZU, R
机构：
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 01期
关键词：
THERMAL FIELD EMISSION (TFE); THERMIONIC EMISSION (TE); EMISSION PATTERN; (310)LAB6 SINGLE-CRYSTAL; BRIGHTNESS;
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Thermal field emission (T.F.E.) from <310> LaB6 single-crystal was, first, successfully used as an electron source of high brightness in a commercial-type transmission electron microscope (TEM). A preliminary experiment for measuring the brightness was performed with TEM, JEM-100CX-FEG, leading to coarse assessment that the brightness of the T.F.E. of (310) spot is two orders of magnitude higher than that of the conventional thermionic emission from LaB6 single-crystal.
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页码：1 / 4
页数：4
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