DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES

被引：437
作者：
BENNINGHOVEN, A [1 ]
机构：
[1] UNIV MUNSTER,PHYSIKAL INST,D-44 MUNSTER,FED REP GER
来源：
SURFACE SCIENCE | 1975年 / 53卷 / DEC期
关键词：
D O I：
10.1016/0039-6028(75)90158-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：596 / 625
页数：30
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