COMPARISON BETWEEN BRIGHT-FIELD AND DARK-FIELD STEM IMAGINGS BASED ON SIGNAL-TO-NOISE RATIO CALCULATIONS

被引：0
|
作者：
SUGIYAMA, S [1 ]
HAYASHI, I [1 ]
HIBINO, M [1 ]
机构：
[1] NAGOYA UNIV,FAC ENGN,DEPT ELECTRON,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1984年 / 33卷 / 03期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：285 / 285
页数：1
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