OPTICAL-CONSTANTS OF VERY THIN GOLD-FILMS IN THE SOFT-X-RAY REGION

被引:13
|
作者
YANAGIHARA, M
CAO, JL
YAMAMOTO, M
ARAI, A
NAKAYAMA, S
MIZUIDE, T
NAMIOKA, T
机构
[1] Tohoku University, Research Institute for Scientific Measurements, Aoba-ku, Sendai, 980
[2] Changchun Institute of Optics and Fine Mechanics, Changchun
[3] Nikon Corporation, Chiyoda-ku, Tokyo, 100
来源
APPLIED OPTICS | 1991年 / 30卷 / 19期
关键词
OPTICAL CONSTANT; SOFT X-RAY; GOLD; THIN FILM; REFLECTANCE;
D O I
10.1364/AO.30.002807
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The optical constants, delta = 1 - n and kappa, of very thin gold films have been determined from the reflectance data obtained in the soft x-ray region of 60-900 eV. The gold films were prepared to various thicknesses, d = 49 - 270 angstrom, by ion beam sputtering (IBS) and electron beam evaporation (EB). A plane parallel slab model with due considerations for the surface and the interface roughness was employed to analyze the reflectance data by least-squares curve fitting. The optical constants determined for the IBS samples definitely show their dependence on the film thickness. It is also found that delta of the 201-angstrom thick IBS film is smaller by approximately 10% than that of the EB film of 212 angstrom thick.
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页码:2807 / 2814
页数:8
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