A CONTACT METHOD FOR SIMULTANEOUS MEASURING THE LIQUID FILM THICKNESS AND TEMPERATURE

被引:2
|
作者
Gatapova, Elizaveta Ya. [1 ,2 ]
Filipenko, Maxim A. [1 ]
Aniskin, Vladimir M. [1 ,3 ]
Kabov, Oleg A. [1 ,2 ]
机构
[1] Russian Acad Sci, Siberian Branch, Kutateladze Inst Thermophys, 1 Lavrentyev Ave, Novosibirsk 630090, Russia
[2] Novosibirsk State Univ, 2 Pirogova Str, Novosibirsk 630090, Russia
[3] Russian Acad Sci, Siberian Branch, Khristianovich Inst Theoret & Appl Mech, Novosibirsk 630090, Russia
基金
俄罗斯科学基金会;
关键词
liquid film thickness; void fraction; temperature jump; liquid-gas interface; evaporation; microthermocouple; temperature measurements; thermal resistance;
D O I
10.1615/InterfacPhenomHeatTransfer.2018029685
中图分类号
O414.1 [热力学];
学科分类号
摘要
We present a contact method for local measurements of liquid film thickness and temperature. The sensing element is a microthermocouple with flat bead working on the Seebeck effect. The bead size of the manufactured thermocouple is less than 3 mu m. A special software is developed which synchronizes microthermocouple readings and the motorized stage position, allowing automatic determination of the thickness of the liquid layer. The interface position is determined as a position of abrupt change in temperature. In some cases this measured temperature difference corresponds to the temperature jump value. In the case of the absence of a temperature difference, the interface position is determined from the difference in temperature gradients, from the so-called fracture of the temperature profile at the interface that occurs due to the difference in thermal conductivity between the gas and the liquid. Four different types of liquid, H2O, C2H5OH, CH2I2 , and HFE-7100, are used in the experiments. This technique simultaneously provides data on the local film thickness and temperature profile, including the temperature value at the liquid-gs interface, using one instrument. Our measurements are in excellent agreement with the measurements by the shadow method. The method can be adopted for measurements of void fraction in two-phase flow. In the case of the existence of measurable temperature jump the thermal resistance of the liquid-gas interface can be estimated.
引用
收藏
页码:187 / 196
页数:10
相关论文
共 50 条
  • [31] In situ simultaneous measurement of temperature and thin film thickness with ultrasonic techniques
    Pei, J
    KhuriYakub, BT
    Degertekin, FL
    Honein, BV
    Stanke, FE
    Saraswat, KC
    1996 IEEE ULTRASONICS SYMPOSIUM, PROCEEDINGS, VOLS 1 AND 2, 1996, : 1039 - 1042
  • [32] Simultaneous Sensing of Film Thickness and Temperature using an InSb Hall element
    Yuji, Jun-ichiro
    Ueda, Tohru
    SENSORS AND SMART STRUCTURES TECHNOLOGIES FOR CIVIL, MECHANICAL, AND AEROSPACE SYSTEMS 2016, 2016, 9803
  • [33] Measuring deformations of the heated liquid film by the fluorescence method
    Chinnov E.A.
    Kharlamov S.M.
    Saprykina A.V.
    Zhukovskaya O.V.
    Thermophys. Aeromech., 2007, 2 (241-246): : 241 - 246
  • [34] Measuring film thickness in the field
    Fletcher, John
    Journal of Protective Coatings and Linings, 2000, 17 (01): : 30 - 36
  • [35] A photochromic dye activation method for measuring the thickness of liquid films
    Kim, J
    Kim, MH
    BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 2005, 26 (06) : 966 - 970
  • [36] Simultaneous measurement of velocity profile and liquid film thickness in horizontal gas-liquid slug flow by using ultrasonic Doppler method
    Zhai, Lusheng
    Xu, Bo
    Xia, Haiyan
    Jin, Ningde
    CHINESE JOURNAL OF CHEMICAL ENGINEERING, 2023, 58 : 323 - 340
  • [37] Effect of film thickness and temperature on condensation and momentum accommodation at the liquid-vapor methane interphase in contact with a quartz substrate
    Soboh, Gbocho Gilles
    To, Quy-Dong
    Graur, Irina
    Topin, Frederic
    Monchiet, Vincent
    Leonard, Celine
    INTERNATIONAL JOURNAL OF THERMAL SCIENCES, 2024, 196
  • [38] Measuring liquid film thickness based on the brightness level of the fluorescence: Methodical overview
    Cherdantsev, Andrey
    Bobylev, Aleksey
    Guzanov, Vladimir
    Kvon, Alexandr
    Kharlamov, Sergey
    INTERNATIONAL JOURNAL OF MULTIPHASE FLOW, 2023, 168
  • [39] A NEW METHOD FOR MEASURING THE THICKNESS OF 2-LAYER FILM MATERIALS
    EMELYANOV, AA
    MEASUREMENT TECHNIQUES USSR, 1991, 34 (09): : 896 - 899
  • [40] Capacitive measuring method of the air-film thickness of aerostatic bearing
    Jing, Yu
    Li, Dongsheng
    International Journal of Nanomanufacturing, 2012, 8 (03) : 173 - 183