BAYESIAN ESTIMATE OF RELIABILITY IN WEIBULL DISTRIBUTION

被引：4
|
作者：
JAYARAM, YG [1 ]
机构：
[1] BANGALORE UNIV,DEPT STATISTICS,BANGALORE 560009,INDIA
来源：
MICROELECTRONICS AND RELIABILITY | 1974年 / 13卷 / 01期
关键词：
D O I：
10.1016/0026-2714(74)90208-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：29 / 32
页数：4
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