RUTHERFORD BACKSCATTERING MEASUREMENTS OF DOPANT CONCENTRATION IN CD-IMPLANTED GALLIUM-ARSENIDE

被引:1
|
作者
INADA, T [1 ]
TAKAHASHI, T [1 ]
SAWADA, M [1 ]
KITAHARA, M [1 ]
机构
[1] HOSEI UNIV,ION BEAM TECHNOL RES CTR,KOGANEI,TOKYO 184,JAPAN
关键词
D O I
10.1016/0168-583X(85)90595-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:438 / 442
页数:5
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