DETERMINATION OF THE THICKNESS OF THIN-FILMS BY THE KIESSIG FRINGE TECHNIQUE

被引：0
|
作者：
MARTINBOUYER, G
DETHY, B
机构：
来源：
ANALUSIS | 1982年 / 10卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：234 / 238
页数：5
相关论文
共 50 条
  • [21] DETERMINATION OF THE LINEAR COEFFICIENT OF THERMAL-EXPANSION IN THE THICKNESS DIRECTION FOR THIN-FILMS
    PASZTOR, AJ
    RADLER, MJ
    CURPHY, JJ
    MARTINEZ, SJ
    LANGHORST, MA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 207 : 257 - PMSE
  • [22] DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES
    RUSLI
    AMARATUNGA, GAJ
    APPLIED OPTICS, 1995, 34 (34): : 7914 - 7924
  • [23] Refractive index and thickness determination of thin-films using Lloyd's interferometer
    Hamza, AA
    Mabrouk, MA
    Ramadan, WA
    Emara, AM
    OPTICS COMMUNICATIONS, 2003, 225 (4-6) : 341 - 348
  • [24] A SIMPLE TECHNIQUE FOR THE DETERMINATION OF MECHANICAL STRAIN IN THIN-FILMS WITH APPLICATIONS TO POLYSILICON
    GUCKEL, H
    RANDAZZO, T
    BURNS, DW
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (05) : 1671 - 1675
  • [25] DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS FROM INTERFERENCE-FRINGE REFLECTION SPECTRA
    JAEGER, JB
    JUNGLING, KC
    FENTER, JR
    JOHNSTON, GT
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (08): : 821 - 821
  • [26] ON THE INTERFEROMETRIC MEASUREMENT OF THE THICKNESS OF VERY THIN-FILMS
    PROROK, VV
    SHAIKEVICH, IA
    OPTIKA I SPEKTROSKOPIYA, 1980, 49 (01): : 122 - 125
  • [27] THICKNESS MEASUREMENTS OF THIN-FILMS DEPOSITED ON SUBSTRATES
    FOULU, J
    HENOC, J
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (06): : 619 - 625
  • [28] THICKNESS MEASUREMENT ON THIN-FILMS WITH UHF SIGNALS
    STERKHOV, VA
    TOKAREV, ND
    ZHARAVIN, AI
    MEASUREMENT TECHNIQUES, 1973, 16 (08) : 1151 - 1153
  • [29] REMOTE ULTRASONIC MEASUREMENT OF THE THICKNESS OF THIN-FILMS
    LEFEBVRE, JE
    BRUNEEL, C
    DELEBARRE, C
    LUTGEN, P
    ECKER, T
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1988, 84 (03): : 1094 - 1096
  • [30] AUTOMATION OF THE PHOTOMETRIC MONITORING OF THE THICKNESS OF THIN-FILMS
    FAZYLZYANOV, RK
    GAINUTDINOV, IS
    KASIMOV, RI
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1989, 56 (11): : 707 - 709
12345