AC MOIRE FRINGE ANALYSIS

被引:0
|
作者
MOORE, DT [1 ]
TRUAX, BE [1 ]
机构
[1] UNIV ROCHESTER,INST OPT,ROCHESTER,NY 14627
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1365 / 1365
页数:1
相关论文
共 50 条
  • [31] Theoretical analysis of moire fringe multiplication under a scanning electron microscope
    Li, Yanjie
    Xie, Huimin
    Chen, Pengwan
    Zhang, Qingming
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2011, 22 (02)
  • [32] MOIRE FRINGE ANALOGS IN UNDERWATER ACOUSTICS
    WESTON, DE
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1961, 33 (04): : 540 - &
  • [33] Fourier and wavelet transform analysis of moire fringe patterns in electronic packaging
    Xiong, CY
    Zhang, J
    Li, M
    Fang, J
    Yi, S
    MICROELECTRONICS INTERNATIONAL, 2004, 21 (02) : 45 - 51
  • [34] 25 YEARS OF MOIRE FRINGE MEASUREMENT
    SHEPHERD, AT
    PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1979, 1 (02): : 61 - 69
  • [35] The Research on the Moire Fringe Image Preprocessing
    Xiao Xiao-guo
    Ao Ming-wu
    Yang Chun-ping
    Yang Ruo-fu
    INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2011: ADVANCES IN IMAGING DETECTORS AND APPLICATIONS, 2011, 8194
  • [36] SENSING DIRECTION OF MOIRE FRINGE MOVEMENT
    SUD, SK
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1977, 17 (02): : 137 - 138
  • [37] TECHNIQUES OF FRINGE INTERPOLATION IN MOIRE PATTERNS
    SCIAMMARELLA, CA
    EXPERIMENTAL MECHANICS, 1967, 7 (11) : A19 - +
  • [38] Fourier analysis for precision displacement measurement with Moire fringe multiplication method
    Lu, HB
    Xu, T
    Chen, XL
    ISTM/2001: 4TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2001, : 85 - 88
  • [39] OPTICAL STRESS-ANALYSIS USING MOIRE FRINGE AND LASER SPECKLES
    CHIANG, FP
    OPTICAL ENGINEERING, 1979, 18 (05) : 448 - 455
  • [40] Encoder fault analysis system based on Moire fringe error signal
    Gao Xu
    Chen Wei
    Wan Qiu-hua
    Lu Xin-ran
    Xie Chun-yu
    FOURTH SEMINAR ON NOVEL OPTOELECTRONIC DETECTION TECHNOLOGY AND APPLICATION, 2018, 10697