YBCO STEP-EDGE JUNCTIONS ON VARIOUS SUBSTRATES

被引：10
|
作者：
PETTIETTEHALL, CL
LUINE, JA
MURDUCK, J
BURCH, JF
HU, R
SERGANT, M
STJOHN, D
机构：
[1] TRW Space & Electronics Group, Redondo Beach, CA 90278, One Space Park
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期
关键词：
D O I：
10.1109/77.402994
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have fabricated YBCO 90 degrees grain boundary junctions on step edges in NdGaO3 and in deposited dielectric (CeO2 on YSZ and SrTiO3 on MgO) in order to,compare junction performance to our standard, LaAlO3. Average I(c)R(n) values at 77 K in the 300-400 mu V range were measured for 2 mu m step edge junctions on NdGaO3, LaAlO3, and SrTiO3/MgO. Junction I-c is greatly reduced with the CeO2/YSZ system. I(c)R(n) values in the 300-400 mu V range were measured at 65 K for 4 mu m junctions.
引用
收藏
页码：2087 / 2090
页数：4
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