THE CHARACTERIZATION OF INSTRUMENTAL PARAMETERS IN THE HIGH-RESOLUTION ELECTRON-MICROSCOPE

被引：0
|
作者：
WILSON, AR [1 ]
SPARGO, AEC [1 ]
SMITH, DJ [1 ]
机构：
[1] UNIV CAMBRIDGE,CAMBRIDGE CB2 3RQ,ENGLAND
来源：
OPTIK | 1982年 / 61卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：63 / 78
页数：16
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