OPTICAL MEASUREMENT OF MICROSCOPIC DEFORMATIONS APPLICATION OF THE SPECKLE INTERFEROMETRY

被引：0
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作者：
SIEBERT, HP
机构：
来源：
F&M-FEINWERKTECHNIK & MESSTECHNIK | 1987年 / 95卷 / 01期
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T [工业技术];
学科分类号：
08 ;
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页码：31 / 33
页数：3
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