A METHOD FOR MEASURING THIN GOLD ELECTRODEPOSITS

被引：0
|
作者：
WERBICKI, JJ [1 ]
机构：
[1] GANNON & SCOTT REFINERS,CRANSTON,RI 02910
来源：
PLATING AND SURFACE FINISHING | 1983年 / 70卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：12 / 12
页数：1
相关论文
共 50 条
  • [31] METHOD FOR MEASURING THERMAL CONDUCTIVITY OF THIN FILMS
    EGOROV, BN
    KONDRATE.VI
    RUBASHOV, IB
    MEASUREMENT TECHNIQUES-USSR, 1970, (03): : 483 - &
  • [32] A method for measuring the microhardness of thin vacuum coatings
    Chumikov, AB
    Akif'ev, VA
    INDUSTRIAL LABORATORY, 2000, 66 (04): : 263 - 265
  • [33] CONTACTLESS METHOD FOR MEASURING CONDUCTANCE OF THIN FILMS
    UDALOV, VF
    MEASUREMENT TECHNIQUES-USSR, 1966, (05): : 658 - &
  • [34] MEASURING THICKNESS OF THIN FILMS BY FLOTATION METHOD
    ANDREEV, GA
    BURITSKOVA, LG
    KLIMOV, VA
    INDUSTRIAL LABORATORY, 1970, 36 (12): : 1899 - +
  • [35] A method for measuring the elastic modulus of thin films
    Shi, JD
    Wu, KH
    Larkins, G
    MATERIALS CHARACTERIZATION, 1997, 38 (4-5) : 301 - 303
  • [36] METHOD FOR MEASURING ELECTRIC PARAMETERS OF THIN FILMS
    SPITSYN, AM
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1967, (02): : 460 - &
  • [37] METHOD OF MEASURING THICKNESSES OF VERY THIN DEPOSITS
    PAATSCH, W
    GALVANOTECHNIK, 1977, 68 (10): : 865 - 868
  • [38] A simple method of forming small gold particles on a thin gold film
    Xiao, MF
    MATERIALS LETTERS, 2002, 52 (4-5) : 301 - 303
  • [39] DYNAMIC-SCALING EXPONENTS AND THE ROUGHENING KINETICS OF GOLD ELECTRODEPOSITS
    VAZQUEZ, L
    SALVAREZZA, RC
    HERRASTI, P
    OCON, P
    VARA, JM
    ARVIA, AJ
    PHYSICAL REVIEW B, 1995, 52 (03): : 2032 - 2037
  • [40] SIMPLE METHOD FOR TESTING ADHESION OF ELECTRODEPOSITS
    AJURIAGARZA, S
    JOURNAL OF CHEMICAL EDUCATION, 1972, 49 (10) : 706 - +
12345