THERMAL-WAVE MICROSCOPY - A NEW APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
BRANDIS, EK [1 ]
机构：
[1] IBM CORP,HOPEWELL JUNCTION,NY 12533
来源：
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1981年 / 28卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：362 / 362
页数：1
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