CURRENT LINES AND ACCURATE CONTACT CURRENT EVALUATION IN 2-D NUMERICAL-SIMULATION OF SEMICONDUCTOR-DEVICES

被引：0
|
作者：
PALM, E [1 ]
VANDEWIELE, F [1 ]
机构：
[1] CATHOLIC UNIV LOUVAIN,DEPT MICROELECTR,PHYS SECT,MICROELECTR LAB,B-1348 LOUVAIN LA NEUVE,BELGIUM
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 04期
关键词：
D O I：
10.1109/TCAD.1985.1270148
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：496 / 503
页数：8
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