CURRENT LINES AND ACCURATE CONTACT CURRENT EVALUATION IN 2-D NUMERICAL-SIMULATION OF SEMICONDUCTOR-DEVICES

被引：0

作者：

PALM, E ^{[1
]}

VANDEWIELE, F ^{[1
]}

机构：

[1] CATHOLIC UNIV LOUVAIN,DEPT MICROELECTR,PHYS SECT,MICROELECTR LAB,B-1348 LOUVAIN LA NEUVE,BELGIUM

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 04期

关键词：

D O I：

10.1109/TCAD.1985.1270148

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：496 / 503

页数：8

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