CARRIER ESCAPE DYNAMICS IN A SINGLE-QUANTUM-WELL WAVE-GUIDE MODULATOR

被引：5
|
作者：
BAMBHA, R
HUTCHINGS, DC
SNELLING, MJ
LIKAMWA, P
MILLER, A
MORETTI, AL
WICKMAN, RW
STAIR, KA
BIRD, TE
CAVAILLES, JA
MILLER, DAB
机构：
[1] AMOCO TECHNOL CO,NAPERVILLE,IL 60566
[2] AT&T BELL LABS,HOLMDEL,NJ 07733
来源：
OPTICAL AND QUANTUM ELECTRONICS | 1993年 / 25卷 / 12期
关键词：
D O I：
10.1007/BF00430338
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.
引用
收藏
页码：S965 / S971
页数：7
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