ANALYSIS OF LASER DESORPTION BY SECONDARY ION MASS-SPECTROMETRY

被引：0

|

作者：

BURNS, AR

机构：

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1983年 / 380卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：224 / 231

页数：8

相关论文

共 50 条

[31] IMPROVED DETECTION LIMITS THROUGH LASER DESORPTION AND MASS-SPECTROMETRY MASS-SPECTROMETRY
COOKS, RG
BUSCH, KL
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1982, 183 (MAR): : 39 - CHED
[32] SEMICONDUCTOR DOPAND ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY
MAUL, JL
FRENZEL, H
TECHNISCHES MESSEN, 1987, 54 (09): : 337 - 342
[33] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS
WERNER, HW
SURFACE SCIENCE, 1975, 47 (01) : 301 - 323
[34] PROBLEMS OF THE LAYER ANALYSIS IN SECONDARY ION MASS-SPECTROMETRY
POPOV, VF
RADIOTEKHNIKA I ELEKTRONIKA, 1992, 37 (10): : 1863 - 1869
[35] TRACE SILVER ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY
CHRYSSOULIS, SL
CHAUVIN, W
SURGES, LJ
CIM BULLETIN, 1985, 78 (878): : 77 - 77
[36] SECONDARY ION MASS-SPECTROMETRY ANALYSIS OF SEMICONDUCTOR LAYERS
SLUSSER, GJ
SLATTERY, JS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 301 - 304
[37] THE ANALYSIS OF OXYGEN IN THE MATERIALS BY THE SECONDARY ION MASS-SPECTROMETRY
LEEFATOU, AV
DOROZHKIN, AA
KOVARSKY, AP
RADIOTEKHNIKA I ELEKTRONIKA, 1992, 37 (10): : 1870 - 1874
[38] NEGATIVE-ION DESORPTION MASS-SPECTROMETRY
ANBAR, M
STJOHN, GA
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1975, 97 (24) : 7195 - 7197
[39] DESORPTION IONIZATION MASS-SPECTROMETRY - SECONDARY ION AND LASER DESORPTION MASS-SPECTRA OF TRANSITION-METAL COMPLEXES OF BETA-DIKETONES
PIERCE, JL
BUSCH, KL
COOKS, RG
WALTON, RA
INORGANIC CHEMISTRY, 1982, 21 (07) : 2597 - 2602
[40] SURFACE-ANALYSIS VIA LASER-DESORPTION ION-TRAP MASS-SPECTROMETRY
KORNIENKO, O
BURROUGHS, JA
HANLEY, L
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 207 : 124 - COLL

← 1 2 3 4 5 →