THE PLASMA-ETCHING OF ELECTRONIC MATERIALS

被引:0
|
作者
MANTEI, TD
机构
来源
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY | 1994年 / 46卷 / 03期
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暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microelectronic fabrication requires the repeated use of etching processes in a variety of materials to delineate fine-scale circuit features with submicrometer dimensions. Plasma-assisted etching combines chemical etching by reactive neutral gas phase species with bombardment by charged plasma ions to form volatile final etch products. This ion-neutral interaction makes possible highly directional etching in semiconductors, metals, polymers, and dielectrics, with satisfactory etch rates and process yields.
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页码:36 / 39
页数:4
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