THE USE OF SURFACE-ANALYSIS TECHNIQUES IN THE STUDY OF WEAR

被引:8
|
作者
GLAESER, WA
机构
[1] Battelle, Columbus Lab, Columbus,, OH, USA, Battelle, Columbus Lab, Columbus, OH, USA
关键词
D O I
10.1016/0043-1648(84)90027-9
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
13
引用
收藏
页码:477 / 487
页数:11
相关论文
共 50 条
  • [41] MEASUREMENT OF GRAIN-BOUNDARY DIFFUSION BY SURFACE-ANALYSIS TECHNIQUES
    BERNARDINI, J
    LEA, C
    HONDROS, ED
    SCRIPTA METALLURGICA, 1981, 15 (06): : 649 - 652
  • [42] SURFACE-ANALYSIS OF COATED FLAT GLASSES - A COMPARISON OF VARIOUS TECHNIQUES
    ARNOLD, GW
    DELLAMEA, G
    DRAN, JC
    KAWAHARA, H
    LEHUEDE, P
    MATZKE, HJ
    MAZZOLDI, P
    NOSHIRO, M
    PANTANO, C
    GLASS TECHNOLOGY, 1990, 31 (02): : 58 - 63
  • [43] PRODUCT IMPROVEMENT WITH SURFACE-ANALYSIS BY ION-BEAM TECHNIQUES
    FERRALLI, MW
    MADURA, AR
    INDUSTRIAL RESEARCH & DEVELOPMENT, 1980, 22 (06): : 138 - 142
  • [44] CONTRIBUTION OF ANALYTICAL TECHNIQUES FOR THE DEVELOPMENT OF MATERIALS - STANDARDIZATION OF SURFACE-ANALYSIS
    GENNAI, N
    TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1995, 81 (04): : 430 - 431
  • [45] PULSED-LASER TECHNIQUES UNTANGLE SURFACE-ANALYSIS SPECTRA
    BRINKMANN, U
    LASER FOCUS-ELECTRO-OPTICS, 1988, 24 (11): : 79 - &
  • [46] SOME UNCONVENTIONAL EXPERIMENTS CROSS CORRELATING THE TECHNIQUES IN SURFACE-ANALYSIS
    CAZAUX, J
    JBARA, O
    KIM, KH
    SURFACE SCIENCE, 1991, 247 (2-3) : 360 - 374
  • [47] WORK FUNCTION MEASUREMENTS AND THEIR RELATION TO MODERN SURFACE-ANALYSIS TECHNIQUES
    HAAS, GA
    THOMAS, RE
    SHIH, A
    MARRIAN, CRK
    ULTRAMICROSCOPY, 1983, 11 (2-3) : 199 - 206
  • [48] CHARACTERIZATION OF NI ON SI WAFERS - COMPARISON OF SURFACE-ANALYSIS TECHNIQUES
    CALAWAY, WF
    COON, SR
    PELLIN, MJ
    GRUEN, DM
    GORDON, M
    DIEBOLD, AC
    MAILLOT, P
    BANKS, JC
    KNAPP, JA
    SURFACE AND INTERFACE ANALYSIS, 1994, 21 (02) : 131 - 137
  • [49] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES BY SURFACE-ANALYSIS TECHNIQUES
    VANOOSTROM, A
    VACUUM, 1984, 34 (10-1) : 881 - 892
  • [50] EVIDENCE FOR THE NEUTRALIZATION OF BORON IN SILICON USING SURFACE-ANALYSIS TECHNIQUES
    KAZMERSKI, LL
    NELSON, AJ
    DHERE, RG
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1994 - 1997