A NON-DESTRUCTIVE APPROACH TO CHARACTERIZE DEPOSITS ON VARIOUS SURFACES

被引：31

作者：

RUCKENSTEIN, E ^{[1
]}

GOURISANKAR, S ^{[1
]}

BAIER, RE ^{[1
]}

机构：

[1] CALSPAN CORP,CTR ADV TECHNOL,BUFFALO,NY 14225

来源：

关键词：

D O I：

10.1016/0021-9797(83)90026-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：245 / 250

页数：6

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