HISTORICAL DEVELOPMENT AND PRINCIPLES OF TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS (TXRF)

被引：36
|
作者：
AIGINGER, H
机构：
[1] Atominstitut der Österreichischen Universitäten, A-1020 Vienna
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1991年 / 46卷 / 10期
关键词：
D O I：
10.1016/0584-8547(91)80180-B
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The historical development of the physical knowledge and the practical application of total reflection X-ray fluorescence analysis (TXRF) is outlined in the introduction. The basic principles of TXRF determining physics and geometry of total-reflection sample support, total-reflection high energy cut-off filters and recent theoretical developments are described together with the principal instrumental developments and the important meeting which stimulated the development and distribution of TXRF.
引用
收藏
页码：1313 / 1321
页数：9
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